Influence of detector geometry on image properties of the stem for thick objects
- 31 December 1977
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 2 (1) , 77-87
- https://doi.org/10.1016/s0304-3991(76)90518-0
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- The influence of plural scattering on the limit of resolution in electron microscopyUltramicroscopy, 1975
- Aperture contrast in thick amorphous specimens using scanning transmission electron microscopyUltramicroscopy, 1975
- Thick specimens in the CEM and STEM. Resolution and image formationUltramicroscopy, 1975
- Emissionsmikroskopische Messung der Ortsverteilung von 20 keV-Elektronen nach Streuung in dünnen Al- und Ge-AufdampfschichtenZeitschrift für Physik B Condensed Matter, 1975
- Measurement of the top bottom effect in scanning transmission electron microscopy of thick amorphous specimensJournal of Microscopy, 1974
- The scattering of electrons by atoms and crystals. I. A new theoretical approachActa Crystallographica, 1957
- Zur Streuung mittelschneller Elektronen in kleinste WinkelZeitschrift für Naturforschung A, 1954
- The Theoretical Resolution Limit of the Electron MicroscopeJournal of Applied Physics, 1949