Thermal stress distributions in GaAs on sawtooth-patterned Si substrates: A finite element approach
- 2 November 1992
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 61 (18) , 2202-2204
- https://doi.org/10.1063/1.108294
Abstract
Thermal stresses in GaAs on sawtooth-patterned Si substrates are studied by elastic finite element analysis under the assumption of plane strain. A comprehensive description of the highly nonuniform stress distribution is given and the possibility of band gap engineering by adjusting the geometrical characteristics of the structure is demonstrated. Results are presented in a form appropriate for interpretation of spectroscopic data and device engineering, and can be easily extended to other materials systems.Keywords
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