Supply current monitoring in cmos circuits for reliability prediction and test
- 1 January 1992
- journal article
- research article
- Published by Wiley in Quality and Reliability Engineering International
- Vol. 8 (6) , 543-548
- https://doi.org/10.1002/qre.4680080606
Abstract
The monitoring of supply current in CMOS VLSI devices has been suggested as a tool for both detecting reliability hazards and increasing the effectiveness of standard functional testing. This paper reviews these techniques and describes a method used at Lancaster for evaluating the IDDQ test.Keywords
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