Simulation and generation of IDDQ tests for bridging faults in combinational circuits
- 1 January 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 45 (10) , 1131-1140
- https://doi.org/10.1109/12.543707
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
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