Built-in current testing
- 1 March 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 27 (3) , 425-428
- https://doi.org/10.1109/4.121566
Abstract
No abstract availableKeywords
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- Testing for Bridging Faults (Shorts) in CMOS CircuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1983