Efficient spectral techniques for sequential ATPG
- 13 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 204-208
- https://doi.org/10.1109/date.2001.915025
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- ITC'99 Benchmark Circuits - Preliminary ResultsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Combinational profiles of sequential benchmark circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Fixed-biased pseudorandom built-in self-test for random pattern resistant circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- HITEC: a test generation package for sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Procedures for static compaction of test sequences for synchronous sequential circuits based on vector restorationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Vector restoration based static compaction of test sequences for synchronous sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Dynamic state traversal for sequential circuit test generationACM Transactions on Design Automation of Electronic Systems, 2000
- A structure and technique for pseudorandom-based testing of sequential circuitsJournal of Electronic Testing, 1995
- When to Use Random TestingIEEE Transactions on Computers, 1978
- A Random and an Algorithmic Technique for Fault Detection Test Generation for Sequential CircuitsIEEE Transactions on Computers, 1971