Improved sequential ATPG using functional observation information and new justification methods
- 19 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 262-266
- https://doi.org/10.1109/edtc.1995.470386
Abstract
Sequential ATPG (Automatic Test Pattern Generation) is a very desirable CAD tool, but to date, the site and complexity of circuits for which sequential ATPG could be performed has been limited. We have discovered a method for collecting functional information which makes fault observation significantly easier. We also propose a new method for state justification which is a combination of function-based methods and structure-based methods. Our sequential ATPG system deals with circuits without a reset state or a synchronizing sequence, and the experimental results show that the proposed method achieves significant improvements over existing sequential ATPG methods.Keywords
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