The impact of technology scaling on ESD robustness and protection circuit design
- 1 June 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A
- Vol. 18 (2) , 314-320
- https://doi.org/10.1109/95.390309
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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