Electron transmission probability across CoSi2/n-Si(111) interfaces measured with a scanning tunneling microscope
- 10 July 1994
- journal article
- other
- Published by Elsevier in Surface Science
- Vol. 314 (1) , L823-L828
- https://doi.org/10.1016/0039-6028(94)90202-x
Abstract
No abstract availableKeywords
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