Generation of test sequences for current testing
- 1 January 1991
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 200-205
- https://doi.org/10.1109/rfts.1991.212945
Abstract
In current testing, measuring the current with a rapid clock rate is a difficult problem, because a CMOS circuit causes a dynamic current. To overcome this problem, a testing circuit which measures the current, including the dynamic current, is proposed. Moreover, the authors describe a test generation method which generates suitable test sequences for proposed circuit. Generated test sequences have the property that almost the same number of transitions occurs between each two consecutive vectors. Finally, they show some experimental results on the test generation of this method.<>Keywords
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