Recent advances in understanding total-dose effects in bipolar transistors
- 1 June 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 43 (3) , 787-796
- https://doi.org/10.1109/23.510714
Abstract
No abstract availableThis publication has 31 references indexed in Scilit:
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