Distributions of boron and phosphorus implanted in silicon in the energy range 0.1–1.5 MeV
- 1 February 1988
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 30 (1) , 1-12
- https://doi.org/10.1016/0168-583x(88)90070-5
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Defect and dopant depth profiles in boron-implanted silicon studied with channeling and nuclear reaction analysisNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
- The annealing of 1 MeV implantations of boron in siliconSolid-State Electronics, 1985
- Range distributions of MeV implants in siliconNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985
- Interaction effects in the weakly localized regime and the anomalous conductivity of Sb-doped Ge at low temperatureSolid-State Electronics, 1985
- Complementary metal-oxide-silicon field-effect transistors fabricated in 4-MeV boron-implanted siliconApplied Physics Letters, 1984
- Range parameters of boron implanted into siliconApplied Physics B Laser and Optics, 1981
- Simulation of doping processesIEEE Transactions on Electron Devices, 1980
- Limitations of the CV technique for ion-implanted profilesIEEE Transactions on Electron Devices, 1975