Application of homing sequences to synchronous sequential circuit testing

1 May 1994

journal article
research article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers

Vol. 43 (5) , 569-580
https://doi.org/10.1109/12.280804

Abstract

A test generation procedure for synchronous sequential circuits is proposed, that is based on the multiple observation times approach, and uses homing sequences, instead of conventionally used synchronizing sequences, to initialize the circuit. A procedure for computing homing sequences in sequential circuits, for which a state-table description is too large to be practical, is described, and experimental results are presented to demonstrate the effectiveness of the proposed test generation procedure.

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