Easily testable iterative logic arrays
- 1 May 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 39 (5) , 640-652
- https://doi.org/10.1109/12.53577
Abstract
[[abstract]]© 1990 Institute of Electrical and Electronics Engineers - Iterative logic arrays (ILAs) are studied with respect to two testing problems. First, a variety of conditions is presented. Meeting these conditions guarantees an upper bound on the size of the test set for the ILA under consideration. Second, techniques for designing optimally testable ILAs are presented. The arrays treated are, in some cases, more general than those that have been reported by other researchers: they include multidimensional and inhomogeneous arrays. Octagonally connected arrays and bilateral arrays are also discussed. The results indicate that the characteristics of the individual cell functions (e.g. whether they are bijective) are a good guide to the test complexity of the overall array. Matrix multiplication, as an example, is shown to have several different optimally testable implementations. The results are useful for combinational and pipelined arrays and for certain systolic arrays[[department]]電機工程學This publication has 23 references indexed in Scilit:
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