Multiplicative window generators of pseudo-random test vectors

23 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

No. 10661409,p. 42-48
https://doi.org/10.1109/edtc.1996.494126

Abstract

New arithmetic two-dimensional generators of pseudo-random test vectors are presented. As an integral part of a recently proposed arithmetic built-in self test (ABIST) environment, all generation functions are executed by basic building blocks performing regular functions of data path architectures, yet the scheme is compatible with scan, parallel scan, partial scan and boundary scan designs. The need for extra hardware is either entirely eliminated or drastically reduced, test vectors can be easily distributed to different modules of the system, and there is virtually no performance degradation.

Keywords

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