Diagnosis of leakage faults with I DDQ
- 1 December 1992
- journal article
- Published by Springer Nature in Journal of Electronic Testing
- Vol. 3 (4) , 367-375
- https://doi.org/10.1007/bf00135340
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Fault Location with Current MonitoringPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Electrical properties and detection methods for CMOS IC defectsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Built-in current testing-feasibility studyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Algorithms for current monitor based diagnosis of bridging and leakage faultsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Accurate modeling and simulation of bridging faultsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Testing for parametric faults in static CMOS circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- QUIETEST: a quiescent current testing methodology for detecting leakage faultsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Test generation for current testing (CMOS ICs)IEEE Design & Test of Computers, 1990
- A method of fault analysis for test generation and fault diagnosisIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- Inductive Fault Analysis of MOS Integrated CircuitsIEEE Design & Test of Computers, 1985