Significance of the failure criterion on transmission line pulse testing
- 1 June 2002
- journal article
- research article
- Published by Elsevier in Microelectronics Reliability
- Vol. 42 (6) , 901-907
- https://doi.org/10.1016/s0026-2714(02)00053-7
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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