Too much delay fault coverage is a bad thing
Top Cited Papers
- 13 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 10893539,p. 624-633
- https://doi.org/10.1109/test.2001.966682
Abstract
Delay fault test application via enhanced scan and skewed load techniques is shown to allow scan-based delay tests to be applied that are unrealizable in normal operation. Rather than higher coverage being a positive feature, it is shown to have negative impact on yield and designer productivity. The use of functionally justified tests is defended by both a motivating example and data from benchmark circuits. Implications on overhead, yield, timing optimization, and test debug are discussed.Keywords
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