Bridging, transition, and stuck-open faults in self-testing CMOS checkers
- 10 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 154-161
- https://doi.org/10.1109/ftcs.1991.146655
Abstract
The consequences of bridging, transition, and stuck-open faults in self-testing checkers designed only for single stuck-at faults are examined. A methodology for design that guarantees that the checkers will be self-testing in the presence of bridging, transition and stuck-open faults is established. This methodology is applied to several implementations of self-testing checkers. Simulations confirm that these checkers are self-testing in the presence of bridging, transition, and stuck-open faults. The problems associated with testing the checkers in the presence of non-stuck-at faults and the problems that result from reducing the number of checker outputs from two to one are discussed. It is shown that self-testing checkers designed for stuck-at faults will remain self-testing in the presence of nonclassical faults.> Author(s) Millman, S.D. Dept. of Electr. Eng. & Comput. Sci., Stanford Univ., CA, USA McCluskey, E.J.Keywords
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