Current testing
- 4 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
Summary form only given. It is pointed out that current testing is and will increasingly become attractive as a main technique for testing static CMOS circuits. BIC (built-in current) testing can provide testing qualities achievable with other testing techniques. It is suggested that future testing approaches geared toward high-quality and/or reliability-oriented testing procedures will be formed using a combination of voltage and current testing methodologies.<>Keywords
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