Single event gate rupture in thin gate oxides
- 1 December 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 44 (6) , 2345-2352
- https://doi.org/10.1109/23.659060
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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